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High-speed XRF Analyzer SEA6000VX SIINT+Carl Zeiss Jointly Developed FIB-SEM EXSTAR X-DSC7000 for Ultimate Performance
What's New
NEWS RELEASE
04/12/2012 new Development of a Photomask Repair Technology for 16 Nanometer Generation
02/01/2012 new Launch of Two Stations for Scanning Probe Microscope equipped with RealTune
12/19/2011 new Launch of the SEA-Hybrid X-ray Particle Inspection System for Lithium Ion Batteries and Fuel Cells
12/19/2011 new Launch of the SFT9500X Series High-Performance Fluorescent X-Ray Coating Thickness Gauge
08/30/2011 Release of the SMI4050 Focused Ion Beam System
08/30/2011 Development of the X-Ray Particle Inspection System for the Lithium Ion Batteries
06/14/2011 Launch of SEA1300VX Fluorescent X-Ray Analyzer for Cadmium Judgment in Rice
INFORMATION
04/17/2009 Announcement of Corporate Headquarters Relocation
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EVENTS
• NATAS 2012 (August 12-15, 2012)
• analytica (April 17-20, 2012)
• Analitika Expo (April 10-13, 2012)
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