High Resolution Able to obtain 250x200mm wide area sample images with technology that ensures high positioning precision by maintaining 20µm resolution throughout the entire area.

Position Designation Digital zoom is done by simply rotating the mouse wheel, allowing you to check part numbers on a board at any location on even wide sample images (left).

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Auto-approach Height adjustment is done manually by top-down irradation type XRF analyzers, but the SEA6000VX has an auto approach function that automatically approaches the results of an auto sample hieght measurement using a laser sensor. This not only improves operability but prevents damaging the instrument or a sample by mistakes in operation.

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High Precision Overlap Function High precision analysis over a wide area is enabled by the complete overlap of sample image and mapping image by employing a telecentric optic system and high precision XY stage. With a non-telecentric lens, analysis is very difficult without matching points specified on the sample image with points on the mapping image when measuring undulating samples.

By overlapping the sample image and mapping image, areas that contain target elements are easily specified. Position precision of overlapping is within 100µm. Overlapping sample images up to a maximum of 3 elements and sequence change is possible. Many tools, such as semi-transparent display and hue adjustment of overlapping images, are provided, greatly improving analysis performance.

[Pb analysis by high precision overlapping]
Figure 1. Pb displayed on surface   Figure 2. Sn displayed on surface
From figure 1 we see that Pb is contained in both A and B. From figure 2 we see that Sn is contained only in A. In other words, A is Pb in solder and B is Pb in chip resistors.

Continuous measurement reporting Measurement results are transferred to Excel by one-click. Results, such as sample information, date of measurement, etc., can be verified in a list. By clicking on the sample number, a quatitative report that includes conditions, the sample image, and spectrum are created in an A4 format and used as the measurement report.

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